Model: Y.CT Modular

Basic parameter

Sample size: diameter < 80 cm

Sample preparation: not required (only solid samples with the highest spatial resolution of 5 micrometres)

Voltage: 25kV – 600 kV          Current range: 0 – 15 mA

Detector: linear- and area-array detectors

Purpose

The device may perform non-invasive X-ray scan imaging of the internal structures of objects of different shapes and materials. It is highly efficient and offers high-resolution images.

The device is equipped with two X-ray sources and detectors, allowing the examination of the internal structures of materials such as metal, ceramic and glass.

Accessory

Six sets of rotary stands of different sizes for different testing requirements.