Basic parameters

    Sample size: no requirement (the imaging of large area requires a relatively flat sample surface)

    Light source: 405 nm semiconductor laser/ white LED

    Total magnification: 108x – 17,280x

Purpose

The device can measure the surface profiles of samples and provide three-dimensional analysis in micro-nano scale, including three-dimensional surface profiles and two-dimensional depth profiles. The rapid-imaging-based measurement is contactless and non-invasive and does not require sample preparation, while the quick stitching feature creates the imaging of large areas.

Accessory

Objectives: 100x, 50x, 20x, 10x and 5x.